Semiconductor detector has lots of advantages, such as good resolution, high sensitivity and wide linear range, which make it the most widely used detector in space exploration of X/＇t Ray. Semiconductor detection system has strict requirements on its electronics system＇s noise level and measurement accuracy. Aiming at these requirements, a new charge measurement system based on the multi-channel charge measurement chip VA32TA5 is designed. This paper gives a detailed introduction of the system＇s design principle and implementation procedure, and also gives the pre- liminary results of performance at the end. Testing results indicate that the system has low noise and good linearity and therefore can be applied to semiconductor detectors, e.g. silicon strip detector, CdZnTe detector.